M.Sc. Daniel Breidenstein

Department Elektrotechnik-Elektronik-Informationstechnik (EEI)
Lehrstuhl für Optoelektronik

Raum 01.026
Konrad-Zuse-Strasse 3/5
91052 Erlangen

Untersuchung von modularen DC-DC Wandler Systemen basierend auf der Dual Active Bridge

Untersuchung eines ISOP-Systems basierend auf LLC-Konvertern mit GaN-Leistungshalbleitern
Methoden zur exakten Ermittlung der Steuerübertragungsfunktion von GaN-basierten asymmetrischen Halbbrücken

Kohlhepp B., Breidenstein D., Pawellek A., Dürbaum T., Dieckerhoff S.:
Modeling of the Dynamic On-State Resistance of GaN-HEMTs
2025 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025 (Nuremberg, DEU, 6. Mai 2025 - 8. Mai 2025)
In: PCIM Europe Conference Proceedings 2025
DOI: 10.30420/566541208

Breidenstein D., Rösel S., Dürbaum T.:
Accurate Analysis of the Control-to-Output Transfer Function of a Boost-Converter including Aliasing Effects of PWM Generation
2024 Energy Conversion Congress & Expo Europe (ECCE Europe) (Darmstadt, 2. September 2024 - 6. September 2024)
DOI: 10.1109/ECCEEurope62508.2024.10751883
Kohlhepp B., Breidenstein D., Dürbaum T.:
Test Setup to Study Threshold Voltage Shift of GaN-HEMTs Under Short- and Long-Term Gate and Drain Bias
In: IEEE Journal of Emerging and Selected Topics in Power Electronics (2024)
ISSN: 2168-6777
DOI: 10.1109/JESTPE.2024.3464613
Rösel S., Breidenstein D., Dürbaum T.:
Exact Analysis of a Control-to-Output Transfer Function of PWM-Converters - A Comparison of Two Methods
PCIM Europe 2024; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (Nürnberg, 11. Juni 2024 - 13. Juni 2024)
DOI: 10.30420/566262223
Rösel S., Breidenstein D., Dürbaum T.:
Transient Measurement Setup for the Output Characteristics with Focus on the Ohmic Region for Si-MOSFETs and GaN-HEMTs
PELSS 2024; Power Electronics Student Summit (Kassel, 21. August 2024 - 23. August 2024)
In: VDE (Hrsg.): PELSS 2024; Power Electronics Student Summit 2024

Breidenstein D., Kohlhepp B., Dürbaum T.:
Cost-Effective Test Setup for Measuring Threshold Voltage Shift of GaN-HEMTs under Long-Term Drain-Voltage Stress
In: IEEE (Hrsg.): 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) 2023
DOI: 10.1109/WiPDA58524.2023.10382213